The ATLAS X Micro-XRF is the very latest in small spot spectrometer engineering. Made by IXRF SYSTEMS with a myriad of markets in mind, it truly is the most versatile Micro-XRF instrument. Solids, liquids, particles, powders; small and large, as well as rough or polished, nearly any sample can be accommodated.
Where other µ-XRF products are deficient, ATLAS was designed to excel. ATLAS leads the industry in virtually every major specification category from the largest chamber and detector active area size, to the longest mapping travel and smallest micro-spot.
Hardware specifications are only half of the ATLAS Advantages. The ATLAS software platform is simply unsurpassed. The functional, flexible, and feature-rich software suite guarantees unprecedented production. ATLAS is not just an instrument, it is the Micro-XRF roadmap of the future.
QUANTUM-RX is an official and authorized distributor of IXRF Systems .
EXCITATION
- Spot size ≥5µ+ with polycapillary optics
- 50kV/50W/1mA Rh target (others available) x-
ray tube - Filter wheel with up to 8 filters positioned
before the focusing optic - Optional use of two x-ray tubes for different
element ranges, targets, and spot sizes
SMALLEST SPOT
HOTTEST TUBE
MOST FILTERS
DETECTORS
- 30mm2 to 150mm2 for increased speed and reduced acquisition times
- ≤130-145eV resolution
MIX & MATCH
LARGEST ACTIVE AREA
4 DETECTORS
STAGES
- Motorized XYZ
- Speeds up to 300mm/s (Map Acquisitions ≤ 1ms/pixel)
- Accuracy less than 1µ
- 10kg+ load capacity
FASTEST STAGE
HIGHEST ACCURACY
HEAVIEST SAMPLE
SAMPLE TYPES AND CONDITIONS
- Air, Vacuum, and Helium
- Vacuum ready in under one minute
- Solids, Liquids, Powders, and Particles
CHAMBER AND GEOMETRY
- Chamber size : 37x26x14in. (950 x 650 x 365 mm)
- Mapping Travel : Up to 400 x 300 mm (Total travel up to 600 x 300 x 150 mm)
- Top-down perpendicular geometry from tube to sample
MOST VOLUME
LONGEST TRAVEL
SPECTRAL COLLECTION & QUANTITATION
- One-click acquisition and automatic peak identification
- Customizable identification, labeling, processing, and quantification
- Scrolling periodic chart
- Drag and drop overlay
- Automatic overlap correction, sum/escape peak removal, background correction, and linear/non-linear deconvolution
- Fundamental Parameters (FP) and Quantitative Match
- Material classification databasing
IMAGING
- Multi-Point automated analysis directly from image
- Morphological processing for rapid feature size measurements
- Image stitching and montage
- Segmentation and feature segregation
- Particle analysis package including border removal, sorting, exclusion, and classification by composition
MAPPING & LINESCANS
- Simultaneous acquisition of 35 elements
- 4096 x 4096 maximum map resolution (4096 linescan resolution)
- Stored spectral data for every pixel
- Live spectrum display during acquisition
- Single or multiple map acquisition from image; overview or spot camera
- Map stitching and montage
- Extract spectra from map: point, area, freehand
- Create linescan from map
- Mouse-over view intensities and concentrations
- Phase Analysis
- Multi-compositional map display of element and compound ranges
- Overlay linescans on image
SPECIALITY & AUTOMATION
- Multilayer thin film and coatings analysis up to 10 layers
- Serpentine continuous mapping (dual directional mapping)
- ASTM E2926-13 Glass Analysis
- Track, store, and recall all stage locations and images
IXRF ATLAS X
- Spot Size down to 5 microns with anti-halo optic
- SDD Detector Active Area up to 150mm2
- Larger Chamber Volume : 37x26x14in. (950x650x365mm)
- 50kv/50 watt tube
- Multipoint/Multi-Area Automation & Mapping
- Air, Vacuum, Helium for Solids, liquids, and powders
- SAMPLE TYPES : Solids, Liquids, Particles, Powders
- SAMPLE CHAMBER SIZE : 20x18x10in. (508x457x254mm)
- MEASUREMENT MEDIA : Air, Vacuum, He
- EXCITATION SOURCE : Primary: 50W / 50kV / 1mASecondary: 4W-12W / 40kV-60kV / 0.4mA-1mA
- EXCITATION PARAMETERS : Aperture or Polycapillary Collimation
- TARGET MATERIALS : Rh (others available)
- TUBE : 50kV, 50W, 1mA (optional 2nd tube)
- SPOT SIZE : ≤5-1000μ
- FILTERS : Up to 8
- GEOMETRY : Top-down Beam (Perpendicular)
- DETECTORS : SDD (Si-Pin upon request)
- RESOLUTION : 130-145eV
- ACTIVE AREA : 50-150mm2
- STAGE : Motorized X,Y,Z (available) 25x25mm up to 320x320mm ranges available
- SAMPLE TRAVEL TOTAL : 320x320x120mm
- MAPPING : 220x200mm
- SAMPLE SPEED : up to 300mm/second
- MAP SCAN SPEED : 1-3ms/pixel
- SAMPLE VIEW : Three Sample Positioning and Analysis Cameras
- INSTRUMENT CONTROL : PC; Windows 10
Complete control of parameters, filters, cameras, optical microscopes, sample illumination and positioning, and measurement media - POWER : 100-240 V, 50/60 Hz
- CERTIFICATIONS : CE, RoHS, Radiation
- ELEMENT RANGE : Na-U
- DIMENSIONS : 35x22x22in (890x560x560mm)
- QUALITY & SAFETY : CE certified RoHS, Radiation < 1 μSv/h
Video demo
